Paper/Poster Title
Simulation of optical properties of dielectric layers from visible to near infrared spectral range
Sponsor
Vishal R. Mehta, PhD
Ohio Northern University
Mechanical Engineering
v-mehta@onu.edu
Advisor(s)
Vishal R. Mehta, PhD
Ohio Northern University
Mechanical Engineering
v-mehta@onu.edu
Document Type
Video
Start Date
23-4-2021 9:00 AM
Abstract
Optical properties of dielectrics play a critical role in various applications including the design and manufacture of optical components & devices such as detectors, filters, imagers, lenses, optical coatings, photonic crystals, sensors and waveguides, and solar cells. Radiative properties of varying thicknesses of different dielectrics such as Aluminum Oxide (Al2O3), Silicon Dioxide (SiO2), Indium Tin Oxide (ITO), Magnesium Fluoride (MgF2) and Silicon Nitride (Si3N4) have been simulated and compared in the range of visible to near infrared by mathematical modelling using MATLAB simulations. The results of the evolution of the radiative properties, as a function of dielectric material thickness, on silicon absorber will be presented.
Recommended Citation
Cochran, Andrew and Conkel, Cory, "Simulation of optical properties of dielectric layers from visible to near infrared spectral range" (2021). ONU Student Research Colloquium. 8.
https://digitalcommons.onu.edu/student_research_colloquium/2021/papers/8
Open Access
Available to all.
Included in
Atomic, Molecular and Optical Physics Commons, Engineering Physics Commons, Optics Commons, Semiconductor and Optical Materials Commons
Simulation of optical properties of dielectric layers from visible to near infrared spectral range
Optical properties of dielectrics play a critical role in various applications including the design and manufacture of optical components & devices such as detectors, filters, imagers, lenses, optical coatings, photonic crystals, sensors and waveguides, and solar cells. Radiative properties of varying thicknesses of different dielectrics such as Aluminum Oxide (Al2O3), Silicon Dioxide (SiO2), Indium Tin Oxide (ITO), Magnesium Fluoride (MgF2) and Silicon Nitride (Si3N4) have been simulated and compared in the range of visible to near infrared by mathematical modelling using MATLAB simulations. The results of the evolution of the radiative properties, as a function of dielectric material thickness, on silicon absorber will be presented.